High resolution measurement
Using the interferometer method, the 8471 achieves a maximum resolution of 0.001 nm (1 pm). Moreover, a high measurement resolution of 0.0001 nm (0.1 pm) is possible by performing average measurement of ten times or more.
High accuracy measurement
The use of a He-Ne laser as reference wavelength enables a high measurement accuracy of 2 ppm. The He-Ne laser provides oscillation with a highly stable wavelength, assuring high accuracy over a long term without calibration.
The 8471 provides a high sampling rate of 10 times per second, so that variation in wavelength due to temperature fluctuation can be detected accurately. Also, it is suitable for adjusting the wavelengths of laser diodes.
Frequency and deviation displays
The 8471 displays not only the wavelength but the frequency of light under measurement, which is very useful for adjusting oscillation wavelengths to the ITU-T grid. Deviation measurement is also made available by pressing the deviation measurement key. Its reference wavelength is selectable from either an input value or a value measured at the moment the key is pressed. It is useful for observing wavelength variation due to temperature fluctuation with high accuracy or adjusting wavelengths.
|Measurement wavelength range||630 to 1650 nm (182 to 476 THz)|
|Accuracy||±2 ppm ±1 pm (LASER measurement mode)|
1 nm to 0.0001 nm
nm (vacuum、 standard air), THz
|Sensitivity||-15 dBm, -20 dBm, -25 dBm, -35dBm|
|Average measurement||Setting number of times: 2 to 100|
|Display||Measured wavelengths , maximum and minimum wavelengths|
*For the detailed specifications, please download the brochure from "Documents."