Optical Wavelength Meter
The 8471 is an optical wavelength meter that uses a He-Ne laser as reference wavelength and employs the Michelson interferometer method, providing high-accuracy measurement. It can measure emission center frequencies of laser diodes for DWDM with high resolution and accuracy. The 8471 even provides a high sampling rate of 10 times per second, and is suitable for oscillation wavelength adjustment. In addition, its deviation display function allows wavelength variation to be measured with high resolution and accuracy.
Using the interferometer method, the 8471 achieves a maximum resolution of 0.001 nm (1 pm). Moreover, a high measurement resolution of 0.0001 nm (0.1 pm) is possible by performing average measurement of ten times or more.
In addition, the use of a He-Ne laser as reference wavelength enables a high measurement accuracy of 2 ppm. The He-Ne laser provides oscillation with a highly stable wavelength, assuring high accuracy over a long term without calibration.
The 8471 provides a high sampling rate of 10 times per second, so that variation in wavelength due to temperature fluctuation can be detected accurately. Also, it is suitable for adjusting the wavelengths of laser diodes.
The 8471 displays not only the wavelength but the frequency of light under measurement, which is very useful for adjusting oscillation wavelengths to the ITU-T grid. Deviation measurement is also made available by pressing the deviation measurement key. Its reference wavelength is selectable from either an input value or a value measured at the moment the key is pressed. It is useful for observing wavelength variation due to temperature fluctuation with high accuracy or adjusting wavelengths.
The 8471 can internally store up to 10,000 data sets. As the measurement interval can be set, measurement data can be stored for a long time without a PC.
|Measurement wavelength range||630 to 1650 nm (182 to 476 THz)|
|Accuracy||±2 ppm ±1 pm (LASER measurement mode)|
1 nm to 0.0001 nm
nm (vacuum、 standard air), THz
|Sensitivity||-15 dBm, -20 dBm, -25 dBm, -35dBm|
|Average measurement||Setting number of times: 2 to 100|
|Display||Measured wavelengths , maximum and minimum wavelengths|
*For the detailed specifications, please download the brochure from "Download."
|Rack mount set (JIS 2 U)||CC022002|
|Rack mount set (EIA 2U)||CC024002|
|Front handle set (2U)||CC028002|
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