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Optical Wavelength Meter

Optical wavelength meter capable of high-accuracy and high-speed measurement

The 8471 is an optical wavelength meter that uses a He-Ne laser as reference wavelength and employs the Michelson interferometer method, providing high-accuracy measurement.
It can measure emission center frequencies of laser diodes for DWDM with high resolution and accuracy.
The 8471 even provides a high sampling rate of 10 times per second, and is suitable for oscillation wavelength adjustment. In addition, its deviation display function allows wavelength variation to be measured with high resolution and accuracy.


High resolution measurement
Using the interferometer method, the 8471 achieves a maximum resolution of 0.001 nm (1 pm). Moreover, a high measurement resolution of 0.0001 nm (0.1 pm) is possible by performing average measurement of ten times or more.

High accuracy measurement
The use of a He-Ne laser as reference wavelength enables a high measurement accuracy of 2 ppm. The He-Ne laser provides oscillation with a highly stable wavelength, assuring high accuracy over a long term without calibration.

High-speed sampling
The 8471 provides a high sampling rate of 10 times per second, so that variation in wavelength due to temperature fluctuation can be detected accurately. Also, it is suitable for adjusting the wavelengths of laser diodes.

Frequency and deviation displays
The 8471 displays not only the wavelength but the frequency of light under measurement, which is very useful for adjusting oscillation wavelengths to the ITU-T grid. Deviation measurement is also made available by pressing the deviation measurement key. Its reference wavelength is selectable from either an input value or a value measured at the moment the key is pressed. It is useful for observing wavelength variation due to temperature fluctuation with high accuracy or adjusting wavelengths.

Measurement wavelength range 630 to 1650 nm (182 to 476 THz)
Accuracy ±2 ppm ±1 pm (LASER measurement mode)
Display resolution

1 nm to 0.0001 nm

Display unit

nm (vacuum、 standard air), THz

Sensitivity -15 dBm, -20 dBm, -25 dBm, -35dBm
Average measurement Setting number of times: 2 to 100 
Display Measured wavelengths , maximum and minimum wavelengths


Memory 10,000 data

*For the detailed specifications, please download the brochure from "Documents."