The 5350 is a low-priced digital electrometer with 5½-digit display. It can measure voltage with high input impedance of 1013 Ω or higher and wide-ranging current from 1 fA to 20 mA.
The electrometer can be used for basic materials research, testing and selecting semiconductors and other electronics components, research and development of new element or materials and many other applications including biological research. For voltage measurement, the driving guard function makes it possible to measure responsively signal sources having high impedance.
Moreover, the 5350 achieves high-speed sampling of up to 1,000 readings per second and stores 100,000 measurement data in the internal memory.
The 5350 provides a 1 fA current measurement resolution, which enables leakage current measurement of semiconductors such as MOSFET gate current and dark current measurement of optical devices. Meanwhile, as the maximum measurement current is 20 mA, it is suitable for IB-VBE or IC-VBE characteristic evaluation of small-signal transistors and diodes.
When using a general voltmeter for high-output impedance voltage measurement, the input impedance of the voltmeter around 109 Ω causes errors in measurement values. However, the 5350 has a high-input impedance of 1013 Ω or more, so that the influence of the output impedance of DUTs is reduced to 1/10,000 compared to the general voltmeter and high-precision measurement is possible.
The response of DC voltage measurement becomes slow depending on the stray capacitance of an input cable when the output impedance of DUTs is high (100 MΩ or more). The 5350 adopts a double-shielded input connector and an input cable, allowing the inner shield to be driven at the same potential as the input voltage of the 5350. By using this driving guard function, the stray capacitance between the center line of the input cable and the outer shield becomes zero apparently and the response performance is improved.
|Circuit diagram (voltage measurement)||Waveform||Features|
||The DMM input is delayed due to electrostatic capacity “C” of the cable and the output resistance “R” of a input signal. (τ=RC[s])|
|Since the driving guard function drives the inside of the double coaxial cable and the 5350 input at the same potential, the electrostatic capacity of the cable is canceled apparently.|
The 5350 has the pre-amplifier output (AMP OUT) and the D/A OUT which output input signals to the outside of the unit as voltage values. The pre-amplifier output can output the output voltage of the measurement circuit of the 5350 without isolation. Thus, it can be used as impedance conversion output device for high-impedance voltage measurement and as current-to-voltage conversion device for current measurement. The D/A OUT converts A/D converted measurement values into voltage ±1 V and outputs them as isolated signals.
The preamplifier output (AMP OUT) function makes it possible to convert voltage signals of high-output resistance to those of low output resistance without deterioration.
Signals can be easily input to measuring instruments that have lower input resistance.
The preamplifier output (AMP OUT) function makes it possible to convert micro current signals that are weak to noise and hardly secure the insulating resistance of measuring systems to voltage signals.
That is, voltage signals can be easily input to other measuring instrument.
The D/A OUT function converts A/D converted measurement values into voltage ±1V.
The isolated output can be connected to other measuring instruments without considering the influence on the measuring systems.
The integration time on the 5350 can be set arbitrarily with a resolution of 100 μs between 500 μs and 3.2 s. This integration function makes it possible to measure easily the average of pulsed voltage or current. As the integration time of the A/D converter itself can be set arbitrarily, there are no omissions in waveforms, resulting in precise average measurement. The pre-set eight types of integration time are switchable by using the RATE key on the front panel.
The 5350 can save up to 100,000 measurement data in the internal data memory.
The highest measurement speed is 1,000 readings per second, allowing high-speed measurement data analysis.