Ultra High Resistance Meter
The 5450/5451 is a state-of-the-art ultra high resistance meter with 5½-digit display that integrates ADC’s traditional technologies and new DC amplifier technologies. It was designed for ease of use so that anybody who operates this instrument can get the same measurement results. The 5450/5451 will be the new standard for insulation resistance measurement or micro current measurement of various kinds of insulating materials or semiconductors.
Such a high-performance instrument, 5450/5451 is used in testing of secondary cell and semiconductor materials or testing of electronic parts such as capacitors and print-circuited boards. In addition, it can be used in various usages for insulating materials such as synthetic resins and rubbers from R&D, manufacturing to quality inspection fields.
The 5450/5451 is a high-performance meter capable of measuring micro current from 1fA to 19.9999mA and high resistance up to 3×1017 Ω(in current function). In addition, with its high-speed sampling capability up to 1000 readings per second, the 5450/5451 is suitable for Go/No-Go test in electronic part manufacturing.
|DUT status and connection diagram|
As internal voltage source, a power supply that is capable of current source and sink up to 10 W at ±1000 V was newly developed. This new power supply also applies negative voltage. Thus, the 5450/5451 can not only measure p-channel and n-channel semiconductors or avalanche photo diodes (APD) that operate with reverse bias voltage, but also help capacitors to be charged or discharged quickly.
In addition, by setting the current limit values at will, devices are protected from overcurrent due to breakdown in semiconductor evaluation.
Actual ultra-high resistance measurement or micro current measurement is sometimes difficult to make under the influence of the ambient noise environment. However, a need exists for high-speed measurement in a noise-proof environment.
To satisfy demands for various purposes, the 5450/5451 employs the variable gain feedback system and the response speed of the ammeter is selectable. Consequently, there is a choice between measurement highly durable against disturbance noise and high-speed measurement with quick response depending on the application or required accuracy, thus ensuring highly reliable measurement.
The 5450/5451 is capable of floating measurement. The 5451 has floating measurement capability up to 46 V peak, however the 5450 up to 1000 V peak that enables a DUT grounded at one side to be measured.
JIS K6911 and K6723 specify temperature and humidity as test conditions for material resistivity measurement. The 5450/5451 can measure the ambient temperature and humidity by connecting the recommended temperature/humidity sensor probe.
In addition to GPIB and USB, the 5450/5451 is equipped with a handler interface that can control the timing with external devices such as a automatic machine in a production line. Moreover, the embedded interlock signal prevents unintended voltage output to help operators perform safety measurement.
For ultra-high resistance or micro current measurement, the amplifier gain, the integration time and the input resistance need to be set according to its purpose. For surface or volume resistivity measurement, the electrode coefficient needs to be set. Like this, various settings are required before measurement.
The 5450/5451 contains ten types of preset conditions for surface or volume resistivity measurement using the accessory, micro current measurement by pico ammeter, capacitor leak current measurement and other measurements. Thus, such a measurement can be started quickly by just selecting the preset condition without long condition settings.
Of course, user parameter settings are also available
【Preset Parameters For Applications】
|High-speed current measurement||
For pico-ammeter usage. Setting for high-speed micro current measurement.
|R measurement||Les than 0.04 μF||Setting for less than 0.04 μF capacitor IR measurement|
|0.04 μF to 4 μF||
Setting for 0.04 μF to 4 μF capacitor IR measurement
|More than 4 μF||
Setting for more than 4 μF capacitor IR measurement
For Φ50 electrodes.
For Φ70 electrodes.
For Φ30.5 electrodes.
|12707 liquid electrode||
Setting for volume resistivity measurement of liquid crystal materials.
|Insulation resistance measurement||High-noise immunity setting for measurement of high-resistance materials under an unshielded environment. The source voltage setting is required.|
|Input resistance 1 kΩ||
The input resistance is 1 kΩregardless of the measurement range.
When insulation resistance is measured by using floating measurement, voltage of the reverse polarity to the setting voltage is generated between the input terminal and the driving guard. Conventional triaxial connectors are not necessarily safe because their metal parts are exposed. The 5450 adopts safer triaxial (S-Triax) connectors, securing measurement.
When the leak current of a capacitor is measured, right after DC voltage is applied, inrush current that is called charge current corresponding to the capacity flows then it decreases exponentially. This current is called absorption current that is caused by the time change during dielectric polarization inside the sample. A current flowing after the absorption current reaches equilibrium becomes leak current. Here, the time it takes the absorption current to decrease exponentially and settle into equilibrium varies depending on the dielectric materials, and is sometimes very long. To measure the leak current precisely, it is important to see if the abruption current settles down. The 5450/5451 has a function to display the time course of measured values graphically on the dot-matrix LCD display. Thus, the measured values described above can be captured visually
The 5450/5451 has a contact check function to detect quickly contact failures between capacitive samples (capacitors) and measurement cables or measurement electrodes. This function is executable when specified or in every measurement. Preceding Open Cal (default value measurement) cancels the capacity of the measurement cables or measurement electrodes, allowing precise contact check.