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5450 / 5451 デジタル超高抵抗/電流計 Ultra High Resistance Meter

Ultra High Resistance Meter
5450/ 5451

  • High resolution of 5½-digit display
  • Micro current measurement: 1 fA to 19.9999 mA
  • High-resistance measurement: 3 x 1017 Ω (current function)
  • Voltage source: ±1 mV to ±1000 V
  • High-speed measurement: up to 1000 readings/s
  • Floating measurement of 1000 V (5450)
  • Temperature and humidity measurement
    (with the optional accessory)
  • Preset function for easy measurement condition setting
  • Sequence program for routine measurement

The 5450/5451 is a state-of-the-art ultra high resistance meter with 5½-digit display that integrates ADC’s traditional technologies and new DC amplifier technologies. It was designed for ease of use so that anybody who operates this instrument can get the same measurement results. The 5450/5451 will be the new standard for insulation resistance measurement or micro current measurement of various kinds of insulating materials or semiconductors.

Such a high-performance instrument, 5450/5451 is used in testing of secondary cell and semiconductor materials or testing of electronic parts such as capacitors and print-circuited boards. In addition, it can be used in various usages for insulating materials such as synthetic resins and rubbers from R&D, manufacturing to quality inspection fields.

BCD(Option)

Features


High performance and high speed

The 5450/5451 is a high-performance meter capable of measuring micro current from 1fA to 19.9999mA and high resistance up to 3×1017 Ω(in current function). In addition, with its high-speed sampling capability up to 1000 readings per second, the 5450/5451 is suitable for Go/No-Go test in electronic part manufacturing.

5450 or 5451 depending on the DUT status

5450

5451 N/A
DUT status and connection diagram

 

Powerful and flexible voltage source

As internal voltage source, a power supply that is capable of current source and sink up to 10 W at ±1000 V was newly developed. This new power supply also applies negative voltage. Thus, the 5450/5451 can not only measure p-channel and n-channel semiconductors or avalanche photo diodes (APD) that operate with reverse bias voltage, but also help capacitors to be charged or discharged quickly.
In addition, by setting the current limit values at will, devices are protected from overcurrent due to breakdown in semiconductor evaluation.

Powerful and flexible voltage source

Selectable ammeter response

Selectable ammeter response

Actual ultra-high resistance measurement or micro current measurement is sometimes difficult to make under the influence of the ambient noise environment. However, a need exists for high-speed measurement in a noise-proof environment.
To satisfy demands for various purposes, the 5450/5451 employs the variable gain feedback system and the response speed of the ammeter is selectable. Consequently, there is a choice between measurement highly durable against disturbance noise and high-speed measurement with quick response depending on the application or required accuracy, thus ensuring highly reliable measurement.

Stable measurement of grounded sample

The 5450/5451 is capable of floating measurement. The 5451 has floating measurement capability up to 46 V peak, however the 5450 up to 1000 V peak that enables a DUT grounded at one side to be measured.

Temperature and humidity measurement

JIS K6911 and K6723 specify temperature and humidity as test conditions for material resistivity measurement. The 5450/5451 can measure the ambient temperature and humidity by connecting the recommended temperature/humidity sensor probe.

Interface selection

In addition to GPIB and USB, the 5450/5451 is equipped with a handler interface that can control the timing with external devices such as a automatic machine in a production line. Moreover, the embedded interlock signal prevents unintended voltage output to help operators perform safety measurement.

5450/5451 各種インタフェース

Preset function for quick operation

For ultra-high resistance or micro current measurement, the amplifier gain, the integration time and the input resistance need to be set according to its purpose. For surface or volume resistivity measurement, the electrode coefficient needs to be set. Like this, various settings are required before measurement.
The 5450/5451 contains ten types of preset conditions for surface or volume resistivity measurement using the accessory, micro current measurement by pico ammeter, capacitor leak current measurement and other measurements. Thus, such a measurement can be started quickly by just selecting the preset condition without long condition settings.
Of course, user parameter settings are also available

【Preset Parameters For Applications】

Application  Description
 High-speed current measurement

For pico-ammeter usage. Setting for high-speed micro current measurement.

R measurement Les than 0.04 μF Setting for less than 0.04 μF capacitor IR measurement
0.04 μF  to 4 μF

 Setting for 0.04 μF to 4 μF capacitor IR measurement

More than 4 μF

Setting for more than 4 μF capacitor IR measurement

JIS measurement K6911

For Φ50 electrodes. 
The sequence program No.2 runs and the volume or surface resistivity after one minute is displayed. The Vol/Surf, sample thickness and source voltage settings are required. This parameter is applicable to C6481 and K6271 as well.

K6723

For Φ70 electrodes. 
The sequence program No.2 runs and the volume or surface resistivity after one minute is displayed. The Vol/Surf, sample thickness and source voltage settings are required.

C2170

For Φ30.5 electrodes.
The sequence program No. 2 runs and the vlume or surface resistivity after 15 seconds with the source voltage of 10 V is displayed. The Vol/Surf and sample thickness are required.

12707 liquid electrode

Setting for volume resistivity measurement of liquid crystal materials.
he sequence program No.2 runs and the volume or surface resistivity after one minute with the source voltage of 5 V is displayed.

Insulation resistance measurement High-noise immunity setting for measurement of high-resistance materials under an unshielded environment. The source voltage setting is required.
Input resistance 1 kΩ 

The input resistance is 1 kΩregardless of the measurement range.

 

Sequence program function

The order of settings or processes is important in each measurement.
The 5450/5451 has a sequence program function to store seven patterns of sequence such as order and conditions of measurements.
This function makes it possible to easily measure insulation resistance one minute after voltage application conforming to JIS.
In addition, anyone can obtain the same measurement results by using the stored setting conditions.。
Sequence program function

Much safer input connector

Much safer input connector

When insulation resistance is measured by using floating measurement, voltage of the reverse polarity to the setting voltage is generated between the input terminal and the driving guard. Conventional triaxial connectors are not necessarily safe because their metal parts are exposed. The 5450 adopts safer triaxial (S-Triax) connectors, securing measurement.

Graphical display of time course

When the leak current of a capacitor is measured, right after DC voltage is applied, inrush current that is called charge current corresponding to the capacity flows then it decreases exponentially. This current is called absorption current that is caused by the time change during dielectric polarization inside the sample. A current flowing after the absorption current reaches equilibrium becomes leak current. Here, the time it takes the absorption current to decrease exponentially and settle into equilibrium varies depending on the dielectric materials, and is sometimes very long. To measure the leak current precisely, it is important to see if the abruption current settles down. The 5450/5451 has a function to display the time course of measured values graphically on the dot-matrix LCD display. Thus, the measured values described above can be captured visually

Graphical display of time course

Contact check function

Contact check function

The 5450/5451 has a contact check function to detect quickly contact failures between capacitive samples (capacitors) and measurement cables or measurement electrodes. This function is executable when specified or in every measurement. Preceding Open Cal (default value measurement) cancels the capacity of the measurement cables or measurement electrodes, allowing precise contact check.

High-speed measurement in auto range

When current function measurement employs an auto range mode, high-speed device measurement is difficult because the switching time between device measurements is required, and it takes long to reach the range for a target value to be measured.
Thus, to improve the takt time, a fixed range mode is normally used for measurement.
However, the upper and lower limits of an auto range can be set on the 5450/5451. Consequently, setting the minimum necessary auto range realizes the minimum switching time and improves the takt time significantly
High-speed measurement in auto range

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